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| Customization: | Available |
|---|---|
| Certification: | RoHS, CE, ISO, CCC, SGS |
| Shape: | GT |
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ZG12N65 is an N-channel enhancement mode MOSFET, which is produced using Zhongxin Micro-electronics's proprietary. The self-aligned planar process and improved terminal technology reduce the conduction loss, improve switching performance and enhance the avalanche energy. The transistor can be used in various power switching circuit for higher efficiency and system miniaturization.
| VDSS | 650 | V |
| ID | 11.5 | A |
| RDS(ON) | 0.65 | Ω |
| Crss | 18 | pF |



Parameter |
Symbol |
Value |
Unit |
|
| - Drain-Source Voltage |
VDSS | 650 | V | |
Continues Drain Current |
ID | Tc=25ºC | 11.5* | A |
| Tc=100ºC | 6.8* | |||
| ( 1) Plused Drain Current (note 1) |
IDM | 46 | A | |
Gate-to-Source Voltage |
VGS | ±30 | V | |
| ( 2) Single Pulsed Avalanche Energy (note 2) |
EAS | 590 | mJ | |
| ( 1) Avalanche Current (note 1) |
IAR | 11 | A | |
| ( 1) Repetitive Avalanche Energy (note 1) |
EAR | 20 | mJ | |
| ( 3) Peak Diode Recovery (note 3) |
dv/dt | 4.5 | V/ns | |
Power Dissipation |
PD Tc=25ºC |
TO-220 | 240 | W |
| TO-220F | 50 | |||
Power Dissipation Derating Factor |
PD(DF) Above 25ºC |
TO-220 | 2.0 | W/ºC |
| TO-220F | 0.4 | |||
| Operating and Storage Temperature Range |
TJ,TSTG | 150,-55~+150 | ºC | |
Maximum Temperature for Soldering |
TL | 300 | ºC | |
Parameter |
Symbol |
Max |
Unit |
|
Thermal Resistance,Junction to Case |
Rth(j-c) | TO-220/TO-262 | 0.52 | W |
| TO-220F | 2.5 | |||
Thermal Resistance,Junction to Ambient |
Rth(j-A) | TO-220 | 62.5 | W/ºC |
| TO-220F | 62.5 | |||
| Off-Characteristics | ||||||
Parameter |
Symbol |
Tests Conditions |
Min |
Type |
Max |
Unit |
| - Drain-Source Breakdown Voltage |
BVDSS | ID=250μA, VGS=0V | 600 | - | - | V |
Breakdown Voltage Temperature Coefficient |
△BVDSS/△TJ | ID=250μA, referenced to 25ºC | - | 0.7 | - | V/ºC |
| Zero Gate Voltage Drain Current |
IDSS | VDS=650V,VGS=0V, TC=25ºC | - | - | 1 | μA |
| VDS=520V, TC=125ºC | - | - | 10 | |||
Gate-body leakage current, forward |
IGSSF | VDS=0V, VGS =30V | - | - | 100 | nA |
Gate-body leakage current, reverse |
IGSSR | VDS=0V, VGS = -30V | - | - | -100 | nA |
| On-Characteristics | ||||||
Parameter |
Symbol |
Tests Conditions |
Min |
Type |
Max |
Unit |
Gate Threshold Voltage |
VGS(th) | VDS = VGS , ID=250μA | 2.0 | - | 4.0 | V |
Static Drain-Source On-Resistance |
RDS(ON) | VGS =10V , ID=6.0A | - | 0.65 | 0.75 | Ω |
Forward Transconductance |
gfs | VDS = 40V, ID=6.0A(note4) | - | 10 | - | S |
| Dynamic Characteristics | ||||||
Parameter |
Symbol |
Tests Conditions |
Min |
Type |
Max |
Unit |
Input capacitance |
Ciss | VDS=25V, VGS =0V, f=1.0MHZ | - | 1887 | 2507 | pF |
Output capacitance |
Coss | - | 188 | 243 | pF | |
Reverse transfer capacitance |
Crss | - | 18 | 28 | pF | |

